Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control

Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control The problems of simulation and characterization of VLSI standard cell libraries designed on the basis of semiconducting CMOS-technologies of the deep submicron and nanometer level are considered. The acceleration methods of the characterization process resulted in the identification of parameters of logic cell macromodels under the multiple simulation of cells on a circuit level for different versions of input actions and under the values of process-dependent parameters and modes of circuit operation. The algorithms of constructing the circuit characterization are directed at decreasing computational expenditures and ensuring the required accuracy of the macromodels. The results of the comparative analysis of different versions of the proposed algorithms are given. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control

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Publisher
SP MAIK Nauka/Interperiodica
Copyright
Copyright © 2011 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739711070067
Publisher site
See Article on Publisher Site

Abstract

The problems of simulation and characterization of VLSI standard cell libraries designed on the basis of semiconducting CMOS-technologies of the deep submicron and nanometer level are considered. The acceleration methods of the characterization process resulted in the identification of parameters of logic cell macromodels under the multiple simulation of cells on a circuit level for different versions of input actions and under the values of process-dependent parameters and modes of circuit operation. The algorithms of constructing the circuit characterization are directed at decreasing computational expenditures and ensuring the required accuracy of the macromodels. The results of the comparative analysis of different versions of the proposed algorithms are given.

Journal

Russian MicroelectronicsSpringer Journals

Published: Dec 4, 2011

References

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