Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control

Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control The problems of simulation and characterization of VLSI standard cell libraries designed on the basis of semiconducting CMOS-technologies of the deep submicron and nanometer level are considered. The acceleration methods of the characterization process resulted in the identification of parameters of logic cell macromodels under the multiple simulation of cells on a circuit level for different versions of input actions and under the values of process-dependent parameters and modes of circuit operation. The algorithms of constructing the circuit characterization are directed at decreasing computational expenditures and ensuring the required accuracy of the macromodels. The results of the comparative analysis of different versions of the proposed algorithms are given. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control

Loading next page...
 
/lp/springer_journal/methods-of-accelerated-characterization-of-vlsi-cell-libraries-with-zV37qDm25Z
Publisher
Springer Journals
Copyright
Copyright © 2011 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739711070067
Publisher site
See Article on Publisher Site

Abstract

The problems of simulation and characterization of VLSI standard cell libraries designed on the basis of semiconducting CMOS-technologies of the deep submicron and nanometer level are considered. The acceleration methods of the characterization process resulted in the identification of parameters of logic cell macromodels under the multiple simulation of cells on a circuit level for different versions of input actions and under the values of process-dependent parameters and modes of circuit operation. The algorithms of constructing the circuit characterization are directed at decreasing computational expenditures and ensuring the required accuracy of the macromodels. The results of the comparative analysis of different versions of the proposed algorithms are given.

Journal

Russian MicroelectronicsSpringer Journals

Published: Dec 4, 2011

References

You’re reading a free preview. Subscribe to read the entire article.


DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Search

Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly

Organize

Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.

Access

Get unlimited, online access to over 18 million full-text articles from more than 15,000 scientific journals.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

DeepDyve

Freelancer

DeepDyve

Pro

Price

FREE

$49/month
$360/year

Save searches from
Google Scholar,
PubMed

Create lists to
organize your research

Export lists, citations

Read DeepDyve articles

Abstract access only

Unlimited access to over
18 million full-text articles

Print

20 pages / month

PDF Discount

20% off