A summary is presented of liquid-crystal thermography as a tool for locating hot spots in the failure analysis of electronic components. The methods are categorized according to whether or not the molecules of the liquid crystal are aligned. Their fields of application are identified. New, highly sensitive techniques and their implementations are presented. Liquid-crystal images of hot spots for ICs and solar cells are discussed.
Russian Microelectronics – Springer Journals
Published: Nov 16, 2007
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