Interval Methods and Their Applications: Invited Sessions at the World Automation Congress (WAC'2000) Maui, Hawaii, June 10–16, 2000

Interval Methods and Their Applications: Invited Sessions at the World Automation Congress... Interval Methods and Their Applications: invited sessions at the World Automation Congress (WAC’2000) Maui, Hawaii, June 10–16, 2000 For all aspects of automation, it is extremely important to take into consideration measurement uncertainty. In most engineering techniques, it is assumed that we know the probabilities of different measurement errors, but in many real-life appli- cations we do not know these probabilities, we only know the upper bounds on the measurement errors. In such situations, if we know the upper bound ∆ on the mea- surement error, then after getting the measurement result x, the only information about the actual (unknown) value x of the measured quantity is that x belongs to the interval [x − ∆ , x + ∆ ]. As a result, we need to deal with interval data. Since its first NASA-related applications in the late 1950s (to compute a trajectory which is guaranteed to reach the Moon), interval computations have been actively used in many automation-related applications, especially in control. To cover such applications, special sessions were organized at WAC’2000. Not surprisingly, many talks were devoted to aerospace applications. M. Berz, K. Maki- no, J. Hoefkens, and J. von Bergmann gave a talk on “Verified http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Reliable Computing Springer Journals

Interval Methods and Their Applications: Invited Sessions at the World Automation Congress (WAC'2000) Maui, Hawaii, June 10–16, 2000

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Publisher
Kluwer Academic Publishers
Copyright
Copyright © 2001 by Kluwer Academic Publishers
Subject
Mathematics; Numeric Computing; Approximations and Expansions; Computational Mathematics and Numerical Analysis; Mathematical Modeling and Industrial Mathematics
ISSN
1385-3139
eISSN
1573-1340
D.O.I.
10.1023/A:1011403908292
Publisher site
See Article on Publisher Site

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