Interaction of electromagnetic H-wave with thin metal film

Interaction of electromagnetic H-wave with thin metal film It is shown that for thin metal films whose thickness does not exceed that of the skin layer the problem can be solved analytically for arbitrary boundary conditions. The transmission, reflection, and absorption coefficients are analyzed as functions of the angle of incidence of the electromagnetic wave, thickness of the layer, specular reflectivity, and field oscillation frequency. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Interaction of electromagnetic H-wave with thin metal film

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Publisher
SP MAIK Nauka/Interperiodica
Copyright
Copyright © 2012 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739712010076
Publisher site
See Article on Publisher Site

Abstract

It is shown that for thin metal films whose thickness does not exceed that of the skin layer the problem can be solved analytically for arbitrary boundary conditions. The transmission, reflection, and absorption coefficients are analyzed as functions of the angle of incidence of the electromagnetic wave, thickness of the layer, specular reflectivity, and field oscillation frequency.

Journal

Russian MicroelectronicsSpringer Journals

Published: Jan 8, 2012

References

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