Impact analysis of statistical variability on the accuracy of a propagation delay time compact model in nano-CMOS technology

Impact analysis of statistical variability on the accuracy of a propagation delay time compact... In this paper, the impact of statistical variability on the accuracy of a propagation delay time compact model (CM) is analyzed. Hence, we aim to select an appropriate CM and extend it in the presence of statistical variability using a number of electrical parameters. Furthermore, we study the impacts of inverter extrinsic parameters (input transition time, load capacitance), environmental parameters (temperature, supply voltage) and device width on propagation delay time variation. The accuracy of extended propagation delay CM is compared with the most accurate results obtained from a library of “atomistic” modelcards. It is shown that both mean and standard deviation (SD) of the propagation delay time almost follow the trend obtained from “atomistic” simulations while changing device width, extrinsic and environmental parameters. The best accuracy occurs when changing device width (W) and load capacitance ( $$C_{L})$$ C L ) . In these cases, a minimum error of 0.03 and 0.01 ps for the mean and SD of the propagation delay time is obtained in reference to “atomistic” results, respectively. The least accuracy occurs when changing $$t_{r}$$ t r and $$C_{L}$$ C L . In these cases, a maximum error of 4.2 and 0.48 ps for the mean and SD of propagation delay time is obtained in reference to “atomistic” results, respectively. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Computational Electronics Springer Journals

Impact analysis of statistical variability on the accuracy of a propagation delay time compact model in nano-CMOS technology

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Publisher
Springer Journals
Copyright
Copyright © 2017 by Springer Science+Business Media, LLC
Subject
Engineering; Mathematical and Computational Engineering; Electrical Engineering; Theoretical, Mathematical and Computational Physics; Optical and Electronic Materials; Mechanical Engineering
ISSN
1569-8025
eISSN
1572-8137
D.O.I.
10.1007/s10825-017-1108-2
Publisher site
See Article on Publisher Site

Abstract

In this paper, the impact of statistical variability on the accuracy of a propagation delay time compact model (CM) is analyzed. Hence, we aim to select an appropriate CM and extend it in the presence of statistical variability using a number of electrical parameters. Furthermore, we study the impacts of inverter extrinsic parameters (input transition time, load capacitance), environmental parameters (temperature, supply voltage) and device width on propagation delay time variation. The accuracy of extended propagation delay CM is compared with the most accurate results obtained from a library of “atomistic” modelcards. It is shown that both mean and standard deviation (SD) of the propagation delay time almost follow the trend obtained from “atomistic” simulations while changing device width, extrinsic and environmental parameters. The best accuracy occurs when changing device width (W) and load capacitance ( $$C_{L})$$ C L ) . In these cases, a minimum error of 0.03 and 0.01 ps for the mean and SD of the propagation delay time is obtained in reference to “atomistic” results, respectively. The least accuracy occurs when changing $$t_{r}$$ t r and $$C_{L}$$ C L . In these cases, a maximum error of 4.2 and 0.48 ps for the mean and SD of propagation delay time is obtained in reference to “atomistic” results, respectively.

Journal

Journal of Computational ElectronicsSpringer Journals

Published: Dec 4, 2017

References

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