Grain Yield Mapping: Yield Sensing, Yield Reconstruction, and Errors

Grain Yield Mapping: Yield Sensing, Yield Reconstruction, and Errors Research findings are reviewed focusing on yield sensing methods, yield reconstruction, mapping, and errors. Yield sensing methods were explained and yield mapping process was briefly introduced. Grain flow through different combines was explained and the effects of combine dynamics on yield measurement accuracy were discussed. Other errors caused by various sensors that are utilized by a yield monitor were included. It was concluded that with proper installation, calibration, and operation of yield monitors, sufficient accuracy can be achieved in yield measurements to make site-specific decisions. Nevertheless, attention must be paid when interpreting yield maps since yield measurement accuracy can vary depending upon the measurement principle, combine grain flow model, size of management area chosen, and the operator's capabilities and carefulness in following instructions to obtain the best accuracy possible under varying field operating conditions. Some of the errors can be filtered out by careful analysis of the raw yield (or flow rate) data provided by yield monitors. Researchers have focused on crop flow models to improve yield reconstruction process. A yield reconstruction algorithm that effectively handles non-linear combine dynamics has not been developed by researchers yet. More efforts towards yield reconstruction should be encouraged. Precision Agriculture Springer Journals

Grain Yield Mapping: Yield Sensing, Yield Reconstruction, and Errors

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Kluwer Academic Publishers
Copyright © 2002 by Kluwer Academic Publishers
Life Sciences; Agriculture; Soil Science & Conservation; Remote Sensing/Photogrammetry; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences; Atmospheric Sciences
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