Gerentology of Silicon Integrated Circuits

Gerentology of Silicon Integrated Circuits The lifetime of silicon ICs in relation to material and component aging is discussed. The service time of the circuits was predicted from accelerated tests. The lifetime of circuits of series 106, 134, 1804, 582, and 136 was evaluated from parameter failures with the Box–Jenkins model. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Gerentology of Silicon Integrated Circuits

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Publisher
Springer Journals
Copyright
Copyright © 2001 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1009490012752
Publisher site
See Article on Publisher Site

Abstract

The lifetime of silicon ICs in relation to material and component aging is discussed. The service time of the circuits was predicted from accelerated tests. The lifetime of circuits of series 106, 134, 1804, 582, and 136 was evaluated from parameter failures with the Box–Jenkins model.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 10, 2004

References

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