Functional-logical simulation of quality of functioning integrated circuits under the effect of radiation and electromagnetic field

Functional-logical simulation of quality of functioning integrated circuits under the effect of... Methods of functional-logical simulation of the radiation behavior and effect of electromagnetic radiation on integrated circuits (ICs) based on the model of the Brauer digital fuzzy automation are considered. A principal distinction of this method from conventional ones is the possibility of taking into account the dependences of radiation resistance and pulsed electric strength on operation mode, functional state, and construction- topological and circuit parameters of ICs in the explicit form in functional-logical models of ICs. The procedures of construction of membership criterion functions of basic elements for ICs of various technologies are considered. Algorithms and recommendations for methods of predicting pulsed electric strength and transient and residual radiation effects in ICs are given. As an example, theoretical and experimental results of simulation of the quality of functioning of LSIC ROM of a series 1656 with respect to residual damages are presented. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Functional-logical simulation of quality of functioning integrated circuits under the effect of radiation and electromagnetic field

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Publisher
Springer Journals
Copyright
Copyright © 2009 by MAIK Nauka
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739709010041
Publisher site
See Article on Publisher Site

Abstract

Methods of functional-logical simulation of the radiation behavior and effect of electromagnetic radiation on integrated circuits (ICs) based on the model of the Brauer digital fuzzy automation are considered. A principal distinction of this method from conventional ones is the possibility of taking into account the dependences of radiation resistance and pulsed electric strength on operation mode, functional state, and construction- topological and circuit parameters of ICs in the explicit form in functional-logical models of ICs. The procedures of construction of membership criterion functions of basic elements for ICs of various technologies are considered. Algorithms and recommendations for methods of predicting pulsed electric strength and transient and residual radiation effects in ICs are given. As an example, theoretical and experimental results of simulation of the quality of functioning of LSIC ROM of a series 1656 with respect to residual damages are presented.

Journal

Russian MicroelectronicsSpringer Journals

Published: Jan 8, 2009

References

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