Fractal Analysis of Anisotropic Surfaces

Fractal Analysis of Anisotropic Surfaces Surface structure is characterized in terms of the fractal dimension and the topothesy. It is highlighted that the calculations of the topothesy reported in the literature yield totally unrealistic values of this quantity: they vary from 10–3m (the earth's surface) to 10–7nm (ground parts of mechanisms). In the context of scanned-probe microscopy (SPM), it is advisable to adopt another definition of the topothesy. Instead of the cutoff wavelength, which is proportional to the length of the specimen, the definition involves the radial wavelength, which can be evaluated by applying the Fourier transform to the SPM micrograph [1]. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Fractal Analysis of Anisotropic Surfaces

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Publisher
Springer Journals
Copyright
Copyright © 2001 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1012593516357
Publisher site
See Article on Publisher Site

Abstract

Surface structure is characterized in terms of the fractal dimension and the topothesy. It is highlighted that the calculations of the topothesy reported in the literature yield totally unrealistic values of this quantity: they vary from 10–3m (the earth's surface) to 10–7nm (ground parts of mechanisms). In the context of scanned-probe microscopy (SPM), it is advisable to adopt another definition of the topothesy. Instead of the cutoff wavelength, which is proportional to the length of the specimen, the definition involves the radial wavelength, which can be evaluated by applying the Fourier transform to the SPM micrograph [1].

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 10, 2004

References

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