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V. Belyakov, A. Chumakov, A. Nikiforov, V. Pershenkov, P. Skorobogatov, A. Sogoyan (2000)
IC’s radiation effects modeling and estimationMicroelectronics Reliability, 40
S. Buchner, M. Baze, D. Brown, D. McMorrow, J. Melinger (1997)
Comparison of error rates in combinational and sequential logicIEEE Transactions on Nuclear Science, 44
J. Pickel (1996)
Single-event effects rate predictionIEEE Transactions on Nuclear Science, 43
S. Buchner, D. McMorrow, J. Melinger, A. Camdbell (1996)
Laboratory tests for single-event effectsIEEE Transactions on Nuclear Science, 43
A.Y. Nikiforov, V.A. Telets, A.I. Chumakov (1994)
Radiatsionnye effekty v KMOP IS
R. Jones (2000)
Comparison between SRAM SEE Cross-Section from Ion Beam Testing with Those Obtained Using a New Picosecond Pulsed Laser FacilityIEEE Trans. Nucl. Sci., 47
R. Jones, A. Chugg, C. Jones, P. Duncan, Chris Dyer, C. Sanderson (1999)
Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)
A. Chumakov, A. Egorov, O. Mavritsky, A. Nikiforov, A. Yanenko (1997)
Single event latchup threshold estimation based on laser dose rate test resultsIEEE Transactions on Nuclear Science, 44
A numerical and a physical simulation are reported of single-event upsets and single-event latchups by laser irradiation with spot diameters ranging from 5 to 50 μm. It is shown that the method can be useful for estimating the threshold values of linear energy transfer if the laser spot covers a number of sensitive regions.
Russian Microelectronics – Springer Journals
Published: Oct 18, 2004
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