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Evaluation of Moderately Focused Laser Irradiation as a Method for Simulating Single-Event Effects

Evaluation of Moderately Focused Laser Irradiation as a Method for Simulating Single-Event Effects A numerical and a physical simulation are reported of single-event upsets and single-event latchups by laser irradiation with spot diameters ranging from 5 to 50 μm. It is shown that the method can be useful for estimating the threshold values of linear energy transfer if the laser spot covers a number of sensitive regions. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Evaluation of Moderately Focused Laser Irradiation as a Method for Simulating Single-Event Effects

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References (8)

Publisher
Springer Journals
Copyright
Copyright © 2004 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
DOI
10.1023/B:RUMI.0000018715.45935.79
Publisher site
See Article on Publisher Site

Abstract

A numerical and a physical simulation are reported of single-event upsets and single-event latchups by laser irradiation with spot diameters ranging from 5 to 50 μm. It is shown that the method can be useful for estimating the threshold values of linear energy transfer if the laser spot covers a number of sensitive regions.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 18, 2004

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