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- Publisher
- Springer Journals
- Copyright
- Copyright © 2008 by Pleiades Publishing, Ltd.
- Subject
- Engineering; Electrical Engineering
- ISSN
- 1063-7397
- eISSN
- 1608-3415
- DOI
- 10.1134/S1063739708010058
- Publisher site
- See Article on Publisher Site
Abstract
The results are presented of a computer and physical simulation concerned with the estimation of CMOS-circuit susceptibility to single-event latchup. A laser-simulation procedure is proposed and tested in which only the most sensitive areas are irradiated. The estimates are found to agree with the measurements.
Journal
Russian Microelectronics – Springer Journals
Published: Jan 18, 2011