Erratum to: Variation of structural, optical, dielectric and magnetic properties of SnO2 nanoparticles

Erratum to: Variation of structural, optical, dielectric and magnetic properties of SnO2... The online version of the original article can be found under doi:10.1007/s10854-016-6101-1. The oxygen content increases steadily with increasing tem- perature, with the Sn:O atomic ratio very near to the stoi- * Jianguo Lu chiometric value of 1:2 at high temperatures suggesting lujianguo@zju.edu.cn the low density of defects. The optical band gap energies State Key Laboratory of Silicon Materials, School of SnO nanoparticles decrease from 4.04 to 3.93  eV as of Materials Science and Engineering, Zhejiang University, the temperatures decrease, while room temperature ferro- Hangzhou 310027, China magnetism and electrical conductivity are enhanced with Department of Physics, Abdul Wali Khan University, reduced temperatures. The presence of oxygen vacancies is Mardan 23200, Khyber Pukhtunkhwa, Pakistan confirmed by EDX, Raman, PL, XPS, and UV–Vis spec- Department Physics, Zhejiang University, Hangzhou 310027, tra. The band gap narrowing due to defects such as oxygen China vacancies has been confirmed in SnO nanoparticles at Institute of Chemical Sciences, University of Peshawar, low calcination temperatures. This visible light emission, Peshawar, Khyber Pukhtunkhwa, Pakistan Vol:.(1234567890) 1 3 J Mater Sci: Mater Electron (2017) 28:13250–13252 13251 enhanced conductivity and room temperature ferromag- netism demonstrate that SnO nanoparticles may be prom- ising in the visible light photo catalysis and optoelectronic devices. Introduction The 4th paragraph in the Introduction section: http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Materials Science: Materials in Electronics Springer Journals

Erratum to: Variation of structural, optical, dielectric and magnetic properties of SnO2 nanoparticles

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Publisher
Springer US
Copyright
Copyright © 2017 by Springer Science+Business Media, LLC
Subject
Materials Science; Optical and Electronic Materials; Characterization and Evaluation of Materials
ISSN
0957-4522
eISSN
1573-482X
D.O.I.
10.1007/s10854-017-7544-8
Publisher site
See Article on Publisher Site

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