Electron–ion recombination in radiation tracks in liquid argon: a computer simulation study

Electron–ion recombination in radiation tracks in liquid argon: a computer simulation study A simulation method is proposed to model electron–ion recombination in radiation tracks in liquid argon at 87 K. The method is applied to calculate the electron escape probability in clusters of up to 20 pairs of electrons and cations that represent a fragment of the track. The results reproduce the basic features of the track recombination in liquid argon observed in experiment. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Research on Chemical Intermediates Springer Journals

Electron–ion recombination in radiation tracks in liquid argon: a computer simulation study

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Publisher
Springer Netherlands
Copyright
Copyright © 2009 by Springer Science+Business Media BV
Subject
Chemistry; Inorganic Chemistry ; Physical Chemistry ; Catalysis
ISSN
0922-6168
eISSN
1568-5675
D.O.I.
10.1007/s11164-009-0047-3
Publisher site
See Article on Publisher Site

Abstract

A simulation method is proposed to model electron–ion recombination in radiation tracks in liquid argon at 87 K. The method is applied to calculate the electron escape probability in clusters of up to 20 pairs of electrons and cations that represent a fragment of the track. The results reproduce the basic features of the track recombination in liquid argon observed in experiment.

Journal

Research on Chemical IntermediatesSpringer Journals

Published: Jun 11, 2009

References

  • Electron-ion recombination rate constants in gaseous, liquid, and solid argon
    Shinsaka, K; Codama, M; Srithanratana, T; Yamamoto, M; Hatano, Y
  • Theoretical analysis of free-ion yield in liquid argon under low-let irradiation
    Burns, WG; Mozumder, A
  • Free-ion yield in liquid argon at low-LET
    Mozumder, A

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