Effect of Film Thickness on Electrical and Magnetic Properties of Nd 0 . 8 Na 0 . 2 MnO 3 Thin Films

Effect of Film Thickness on Electrical and Magnetic Properties of Nd 0 . 8 Na 0 . 2 MnO 3 Thin... Nd0.8Na0.2MnO3 thin films were grown on (001)-oriented LaAlO3 substrate for thickness in the range of 30 to 100 nm by using radio-frequency (RF) magnetron sputtering. All films are found to grow epitaxially along the (001) orientation of the substrate. The out-of-plane lattice constant is found to decrease from 3.862 Å for 30 nm thick film to 3.853 Å for 100 nm film. These films exhibit out-of-plane tensile strain and their magnitude is found to decrease with an increase in film thickness. The Raman spectra show the signature of the presence of a charge ordered phase. The temperature variation of magnetization measurement shows the signature of charge ordering transition around 190 K followed by low temperature (T < 100 K) ferromagnetic transition. The M-H loops recorded at 30 K show typical ferromagnetic behaviour with a maximum saturation magnetization of 2.47 μ B/f.u. The electrical resistivity data are found to follow the variable range hopping model. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Superconductivity and Novel Magnetism Springer Journals

Effect of Film Thickness on Electrical and Magnetic Properties of Nd 0 . 8 Na 0 . 2 MnO 3 Thin Films

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Publisher
Springer US
Copyright
Copyright © 2017 by Springer Science+Business Media New York
Subject
Physics; Strongly Correlated Systems, Superconductivity; Magnetism, Magnetic Materials; Condensed Matter Physics; Characterization and Evaluation of Materials
ISSN
1557-1939
eISSN
1557-1947
D.O.I.
10.1007/s10948-017-4030-8
Publisher site
See Article on Publisher Site

Abstract

Nd0.8Na0.2MnO3 thin films were grown on (001)-oriented LaAlO3 substrate for thickness in the range of 30 to 100 nm by using radio-frequency (RF) magnetron sputtering. All films are found to grow epitaxially along the (001) orientation of the substrate. The out-of-plane lattice constant is found to decrease from 3.862 Å for 30 nm thick film to 3.853 Å for 100 nm film. These films exhibit out-of-plane tensile strain and their magnitude is found to decrease with an increase in film thickness. The Raman spectra show the signature of the presence of a charge ordered phase. The temperature variation of magnetization measurement shows the signature of charge ordering transition around 190 K followed by low temperature (T < 100 K) ferromagnetic transition. The M-H loops recorded at 30 K show typical ferromagnetic behaviour with a maximum saturation magnetization of 2.47 μ B/f.u. The electrical resistivity data are found to follow the variable range hopping model.

Journal

Journal of Superconductivity and Novel MagnetismSpringer Journals

Published: Mar 13, 2017

References

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