Effect of Discontinuities on ULSI On-Chip Interconnection Characteristics

Effect of Discontinuities on ULSI On-Chip Interconnection Characteristics Characteristics of nonuniform on-chip interconnections are studied theoretically. The nonuniformity is treated as an effect of the interconnection geometry. For crossover and bend sections, approximate formulas that characterize the nonuniformity of capacitance per unit length are derived. Conditions for the waveguide propagation of current or voltage pulses over such lines are ascertained on the basis of model solutions. The generation of noise by discontinuities is analyzed in the case of a lossless periodic line. High-frequency ranges in which unstable transmission occurs are determined, depending on the period of the line and the rate of change of capacitance per unit length. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Effect of Discontinuities on ULSI On-Chip Interconnection Characteristics

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2002 by MAIK "Nauka/Interperiodica"
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1020247227268
Publisher site
See Article on Publisher Site

References

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