Diagnostics of the technological characteristics of high–power transistors using relaxation impedance spectrometry of thermal processes

Diagnostics of the technological characteristics of high–power transistors using relaxation... An efficient method of determining thermal parameters in high-power field-effect transistors has been developed and tested based on a study of transient processes during self-heating by direct current. With the developed relaxation spectrometer of the thermal processes, the differential distribution profiles of thermal resistance of KP723G transistors, which were selected in accordance with the regimes of the setting of their crystals, have been investigated. Thermal resistance spectra have been obtained from the analysis of time-dependent dynamic thermal impedance using a new nondestructive method of differential spectroscopy using higher order derivatives (order 3). We present both the continuous (integral) and discrete spectra of the distribution of the internal thermal resistance in the transistors and the value of the junction/case thermal resistance. The thermal characteristics of the KP723G transistors and their imported counterparts IRLZ44 and IRLB3036 have been determined. The method of determining the active region of the devices has been developed and its decrease during heating has been shown. The proposed methodology is useful in solving technological problems for forming the setting layers of the crystals and intermediate layers between the crystal and the heat sink, as well as for the development of thermal models in the SPICE modeling of powerful MOSFETs and diode emitters. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Diagnostics of the technological characteristics of high–power transistors using relaxation impedance spectrometry of thermal processes

Loading next page...
 
/lp/springer_journal/diagnostics-of-the-technological-characteristics-of-high-power-zUrABOyQzy
Publisher
Pleiades Publishing
Copyright
Copyright © 2015 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739715080144
Publisher site
See Article on Publisher Site

References

You’re reading a free preview. Subscribe to read the entire article.


DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 12 million articles from more than
10,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Unlimited reading

Read as many articles as you need. Full articles with original layout, charts and figures. Read online, from anywhere.

Stay up to date

Keep up with your field with Personalized Recommendations and Follow Journals to get automatic updates.

Organize your research

It’s easy to organize your research with our built-in tools.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

Monthly Plan

  • Read unlimited articles
  • Personalized recommendations
  • No expiration
  • Print 20 pages per month
  • 20% off on PDF purchases
  • Organize your research
  • Get updates on your journals and topic searches

$49/month

Start Free Trial

14-day Free Trial

Best Deal — 39% off

Annual Plan

  • All the features of the Professional Plan, but for 39% off!
  • Billed annually
  • No expiration
  • For the normal price of 10 articles elsewhere, you get one full year of unlimited access to articles.

$588

$360/year

billed annually
Start Free Trial

14-day Free Trial