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A. Petrov, A. Vasil'ev, A. Ulanova, A. Chumakov, A. Nikiforov (2014)
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Methods are proposed to estimate the relationship between probabilistic and order models for simulating functional failures of the large-scale integrated circuits (LSICs) based on Brauer’s fuzzy digital automaton and on a probabilistic automaton for reliability evaluation. In the first case, the behavior of the LSIC is determined by varying static and dynamic parameters; in the second case, by the statistical straggling of threshold failure levels.
Russian Microelectronics – Springer Journals
Published: Sep 2, 2015
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