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Deterministic and nondeterministic failure models of LSI circuits exposed to radiation

Deterministic and nondeterministic failure models of LSI circuits exposed to radiation Methods are proposed to estimate the relationship between probabilistic and order models for simulating functional failures of the large-scale integrated circuits (LSICs) based on Brauer’s fuzzy digital automaton and on a probabilistic automaton for reliability evaluation. In the first case, the behavior of the LSIC is determined by varying static and dynamic parameters; in the second case, by the statistical straggling of threshold failure levels. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Deterministic and nondeterministic failure models of LSI circuits exposed to radiation

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References (17)

Publisher
Springer Journals
Copyright
Copyright © 2015 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
DOI
10.1134/S1063739715050030
Publisher site
See Article on Publisher Site

Abstract

Methods are proposed to estimate the relationship between probabilistic and order models for simulating functional failures of the large-scale integrated circuits (LSICs) based on Brauer’s fuzzy digital automaton and on a probabilistic automaton for reliability evaluation. In the first case, the behavior of the LSIC is determined by varying static and dynamic parameters; in the second case, by the statistical straggling of threshold failure levels.

Journal

Russian MicroelectronicsSpringer Journals

Published: Sep 2, 2015

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