A procedure for determining the diffusion length of charge minority carriers (CMCs), which uses digital oscillography to detect surface photovoltage (SPV), is considered. It is shown by experiments that the shape of pulses of SPV, excited by rectangular IR pulses, depends significantly on both their intensity and wavelength. It is shown that it is not valid to use a synchronous detector to measure the quasi-stationary SPV when determining the diffusion length of CMCs in semiconductors, because, in a number of cases, it results in an uncontrollable error that reaches 100% and more. A technique is developed for determining the diffusion length in silicon wafers and epitaxial structures with the specific resistance range 0.01–12 Ω cm, the diffusion length range 5–500 μm, and an error of not more than 8%.
Russian Microelectronics – Springer Journals
Published: Jan 21, 2010
It’s your single place to instantly
discover and read the research
that matters to you.
Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.
All for just $49/month
Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly
Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.
Get unlimited, online access to over 18 million full-text articles from more than 15,000 scientific journals.
Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.
All the latest content is available, no embargo periods.
“Hi guys, I cannot tell you how much I love this resource. Incredible. I really believe you've hit the nail on the head with this site in regards to solving the research-purchase issue.”Daniel C.
“Whoa! It’s like Spotify but for academic articles.”@Phil_Robichaud
“I must say, @deepdyve is a fabulous solution to the independent researcher's problem of #access to #information.”@deepthiw
“My last article couldn't be possible without the platform @deepdyve that makes journal papers cheaper.”@JoseServera