Deep Traps in ZnxCd1 – xTe(Cl) Solid Solutions

Deep Traps in ZnxCd1 – xTe(Cl) Solid Solutions The parameters of deep traps in ZnCdTe(Cl) solid solutions were found with the method of thermally stimulated capacitor discharge (TCD). It was shown that the vapor-grown single crystals have a rather low concentration of deep traps, which influence nonequilibrium-carrier transfer. It seems that vapor-grown single-crystal quasi-binary ZnCdTe compounds are candidates for high-temperature ionizing-radiation detectors. From our results, it also follows that the TCD current method is helpful in investigating and selecting a detector-grade material. Russian Microelectronics Springer Journals

Deep Traps in ZnxCd1 – xTe(Cl) Solid Solutions

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Kluwer Academic Publishers-Plenum Publishers
Copyright © 2001 by MAIK “Nauka/Interperiodica”
Engineering; Electrical Engineering
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