Composition design and electrical properties in BiFeO3–BaTiO3–Bi(Zn0.5Ti0.5)O3 lead-free ceramics

Composition design and electrical properties in BiFeO3–BaTiO3–Bi(Zn0.5Ti0.5)O3 lead-free... Here we fabricated the (1−y)[(1−x)BiFeO3–xBaTiO3]–yBi(Zn0.5Ti0.5)O3 ceramics by the conventional solid-state method, and then a large piezoelectric constant (d 33) of ~195 pC/N together with a high Curie temperature (T C = 505 °C) could be attained in the ceramics by building the rhombohedral–cubic (R–C) phase boundary. The R–C phase coexistence can be shown in the ceramics with 0.25 ≤ x ≤ 0.35 and 0.01 ≤ y ≤ 0.05. In particular, both a high remnant polarization (P r = 18.5 μC/m2) and a relatively high strain of ~0.19% were also observed in the phase coexistence region. In addition, the thermal stability together with the effects of polarization temperature and cooling-down method was also explored. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Materials Science: Materials in Electronics Springer Journals

Composition design and electrical properties in BiFeO3–BaTiO3–Bi(Zn0.5Ti0.5)O3 lead-free ceramics

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Publisher
Springer US
Copyright
Copyright © 2017 by Springer Science+Business Media New York
Subject
Materials Science; Optical and Electronic Materials; Characterization and Evaluation of Materials
ISSN
0957-4522
eISSN
1573-482X
D.O.I.
10.1007/s10854-017-7140-y
Publisher site
See Article on Publisher Site

Abstract

Here we fabricated the (1−y)[(1−x)BiFeO3–xBaTiO3]–yBi(Zn0.5Ti0.5)O3 ceramics by the conventional solid-state method, and then a large piezoelectric constant (d 33) of ~195 pC/N together with a high Curie temperature (T C = 505 °C) could be attained in the ceramics by building the rhombohedral–cubic (R–C) phase boundary. The R–C phase coexistence can be shown in the ceramics with 0.25 ≤ x ≤ 0.35 and 0.01 ≤ y ≤ 0.05. In particular, both a high remnant polarization (P r = 18.5 μC/m2) and a relatively high strain of ~0.19% were also observed in the phase coexistence region. In addition, the thermal stability together with the effects of polarization temperature and cooling-down method was also explored.

Journal

Journal of Materials Science: Materials in ElectronicsSpringer Journals

Published: May 19, 2017

References

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