Comparison of charge transport studies of chemical solution and pulsed laser deposited manganite-based thin film devices

Comparison of charge transport studies of chemical solution and pulsed laser deposited... The electrical transport properties of manganites play a significant role in the diverse applications of spintronics. In this communication, we report the variation in the electrical transport properties of Y0.95Ca0.05MnO3 (YCMO) films deposited on (100) single crystalline Si substrates by two different deposition techniques: chemical solution deposition (CSD) and pulsed laser deposition (PLD). The charge conduction mechanisms responsible for the electrical transport properties of these films have been studied across the YCMO/Si junctions using temperature-dependent current–voltage (I–V) and resistance–voltage characteristics and results have been compared for both the devices fabricated by CSD and PLD techniques. The role of structural strain and space charge limited conduction (SCLC) processes has been discussed to understand the results of I–V and electroresistance (ER) behavior across the junctions. The CSD grown films exhibits better electrical transport properties at the junction, i.e., high current across the junction, low junction resistance and large ER, and this has been discussed in detail on the basis of low structural strain present at the interface. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Applied Physics A: Materials Science Processing Springer Journals

Comparison of charge transport studies of chemical solution and pulsed laser deposited manganite-based thin film devices

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Publisher
Springer Berlin Heidelberg
Copyright
Copyright © 2017 by Springer-Verlag GmbH Germany
Subject
Physics; Condensed Matter Physics; Optical and Electronic Materials; Nanotechnology; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Operating Procedures, Materials Treatment
ISSN
0947-8396
eISSN
1432-0630
D.O.I.
10.1007/s00339-017-1172-2
Publisher site
See Article on Publisher Site

Abstract

The electrical transport properties of manganites play a significant role in the diverse applications of spintronics. In this communication, we report the variation in the electrical transport properties of Y0.95Ca0.05MnO3 (YCMO) films deposited on (100) single crystalline Si substrates by two different deposition techniques: chemical solution deposition (CSD) and pulsed laser deposition (PLD). The charge conduction mechanisms responsible for the electrical transport properties of these films have been studied across the YCMO/Si junctions using temperature-dependent current–voltage (I–V) and resistance–voltage characteristics and results have been compared for both the devices fabricated by CSD and PLD techniques. The role of structural strain and space charge limited conduction (SCLC) processes has been discussed to understand the results of I–V and electroresistance (ER) behavior across the junctions. The CSD grown films exhibits better electrical transport properties at the junction, i.e., high current across the junction, low junction resistance and large ER, and this has been discussed in detail on the basis of low structural strain present at the interface.

Journal

Applied Physics A: Materials Science ProcessingSpringer Journals

Published: Jul 31, 2017

References

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