Chemical bath deposition of thin nanocrystalline tin(II) sulfide films with thioacetamide

Chemical bath deposition of thin nanocrystalline tin(II) sulfide films with thioacetamide Nanocrystalline tin(II) sulfide layers 100–650 nm thick were prepared by hydrochemical deposition on glass–ceramic supports from a citrate system at 323−343 K using thioacetamide as chalcogenizing agent. These films are of interest for the development of thin-film solar radiation converters based on the multicomponent compound Cu2ZnSnS4 of kesterite structure, prepared using a cost-saving process. Examination by scanning electron microscopy shows that tin(II) sulfide layers are formed from spherical nanocrystallites of 20–40 nm size. X-ray diffraction analysis shows that they crystallize in the orthorhombic system with the unit cell parameters a = 4.276, b = 11.243, and c = 3.986 Å. Analysis by X-ray photoelectron spectroscopy revealed the presence of up to 44.86 at. % oxygen in the surface layer of the film. This oxygen is mainly present in surface contaminants and is also incorporated in SnO present on the surface. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Journal of Applied Chemistry Springer Journals

Chemical bath deposition of thin nanocrystalline tin(II) sulfide films with thioacetamide

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Publisher
Pleiades Publishing
Copyright
Copyright © 2017 by Pleiades Publishing, Ltd.
Subject
Chemistry; Chemistry/Food Science, general; Industrial Chemistry/Chemical Engineering
ISSN
1070-4272
eISSN
1608-3296
D.O.I.
10.1134/S1070427217010141
Publisher site
See Article on Publisher Site

Abstract

Nanocrystalline tin(II) sulfide layers 100–650 nm thick were prepared by hydrochemical deposition on glass–ceramic supports from a citrate system at 323−343 K using thioacetamide as chalcogenizing agent. These films are of interest for the development of thin-film solar radiation converters based on the multicomponent compound Cu2ZnSnS4 of kesterite structure, prepared using a cost-saving process. Examination by scanning electron microscopy shows that tin(II) sulfide layers are formed from spherical nanocrystallites of 20–40 nm size. X-ray diffraction analysis shows that they crystallize in the orthorhombic system with the unit cell parameters a = 4.276, b = 11.243, and c = 3.986 Å. Analysis by X-ray photoelectron spectroscopy revealed the presence of up to 44.86 at. % oxygen in the surface layer of the film. This oxygen is mainly present in surface contaminants and is also incorporated in SnO present on the surface.

Journal

Russian Journal of Applied ChemistrySpringer Journals

Published: Apr 25, 2017

References

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