An approach to estimating the relationship between probabilistic and fuzzy models is proposed for simulating failures of large-scale integrated circuits (LSICs). These models are based on Brouwer’s fuzzy digital automaton and topological probabilistic models for estimating the functionality of digital devices. In the first case, the behavior of an LSIC is determined by the variation of deterministic static and dynamic parameters, and, in the second case, by the statistical dispersion of threshold failure levels.
Russian Microelectronics – Springer Journals
Published: Mar 26, 2014
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