Application of probabilistic and fuzzy models to the simulation of radiation failures of LSI circuits

Application of probabilistic and fuzzy models to the simulation of radiation failures of LSI... An approach to estimating the relationship between probabilistic and fuzzy models is proposed for simulating failures of large-scale integrated circuits (LSICs). These models are based on Brouwer’s fuzzy digital automaton and topological probabilistic models for estimating the functionality of digital devices. In the first case, the behavior of an LSIC is determined by the variation of deterministic static and dynamic parameters, and, in the second case, by the statistical dispersion of threshold failure levels. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Application of probabilistic and fuzzy models to the simulation of radiation failures of LSI circuits

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Publisher
Pleiades Publishing
Copyright
Copyright © 2014 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739714020024
Publisher site
See Article on Publisher Site

Abstract

An approach to estimating the relationship between probabilistic and fuzzy models is proposed for simulating failures of large-scale integrated circuits (LSICs). These models are based on Brouwer’s fuzzy digital automaton and topological probabilistic models for estimating the functionality of digital devices. In the first case, the behavior of an LSIC is determined by the variation of deterministic static and dynamic parameters, and, in the second case, by the statistical dispersion of threshold failure levels.

Journal

Russian MicroelectronicsSpringer Journals

Published: Mar 26, 2014

References

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