Application features of the error correction coding in sub-100-nm memory microcircuits for cosmic systems

Application features of the error correction coding in sub-100-nm memory microcircuits for cosmic... The studies performed in the process of designing error correction coding elements in sub-100-nm memory and microprocessor microcircuits confirm that the most efficiency of increasing upset tolerances of commercial RHBD memory microcircuits can be ensured by combining modern circuit solutions for memory elements and algorithmic data encoding and protection methods. Among the circuit methods, the following methods are urgent: the application of DICE memory cells for checking (reference) data files; the introduction of additional columns and multiplexers, intended to replace any column with an additional one, if a multiple incurable upset arises in this column; the implementation of data interleaving with a degree of no more than 8 s to minimize adjacent upsets in the code word. Algorithmic encoding approaches of (SEC-DED-DAEC) classes (single-error correction, double-error-detection, and double-adjacent-error-correction) are efficient for ensuring the upset tolerance of sub-100-nm very-largescale integration (VLSI) circuits under the external action of single nuclear particles. The encoding algorithm based on these recommendations demonstrated up to 27% better efficiency of correction of nonadjacent double errors at a slightly slower speed of operation and occupied on-chip area, as compared with Datta and Choi codes, thus allowing one to implement different implementation versions of upset tolerant VLSI circuits, depending on the solved problem. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Application features of the error correction coding in sub-100-nm memory microcircuits for cosmic systems

Loading next page...
 
/lp/springer_journal/application-features-of-the-error-correction-coding-in-sub-100-nm-LPtG6BdbtR
Publisher
Springer Journals
Copyright
Copyright © 2013 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739712040087
Publisher site
See Article on Publisher Site

Abstract

The studies performed in the process of designing error correction coding elements in sub-100-nm memory and microprocessor microcircuits confirm that the most efficiency of increasing upset tolerances of commercial RHBD memory microcircuits can be ensured by combining modern circuit solutions for memory elements and algorithmic data encoding and protection methods. Among the circuit methods, the following methods are urgent: the application of DICE memory cells for checking (reference) data files; the introduction of additional columns and multiplexers, intended to replace any column with an additional one, if a multiple incurable upset arises in this column; the implementation of data interleaving with a degree of no more than 8 s to minimize adjacent upsets in the code word. Algorithmic encoding approaches of (SEC-DED-DAEC) classes (single-error correction, double-error-detection, and double-adjacent-error-correction) are efficient for ensuring the upset tolerance of sub-100-nm very-largescale integration (VLSI) circuits under the external action of single nuclear particles. The encoding algorithm based on these recommendations demonstrated up to 27% better efficiency of correction of nonadjacent double errors at a slightly slower speed of operation and occupied on-chip area, as compared with Datta and Choi codes, thus allowing one to implement different implementation versions of upset tolerant VLSI circuits, depending on the solved problem.

Journal

Russian MicroelectronicsSpringer Journals

Published: Jan 4, 2013

References

You’re reading a free preview. Subscribe to read the entire article.


DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Search

Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly

Organize

Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.

Access

Get unlimited, online access to over 18 million full-text articles from more than 15,000 scientific journals.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

DeepDyve

Freelancer

DeepDyve

Pro

Price

FREE

$49/month
$360/year

Save searches from
Google Scholar,
PubMed

Create lists to
organize your research

Export lists, citations

Read DeepDyve articles

Abstract access only

Unlimited access to over
18 million full-text articles

Print

20 pages / month

PDF Discount

20% off