A typical structure of modern hybrid microcircuits of pulse voltage stabilizers (PVSs) is analyzed. Experiential studies of dose and single-event local ionization effects in basic units of modern pulse voltage stabilizers are performed. The model of pulse voltage stabilizers for analyzing single-event effects is proposed, and its experimental verification is fulfilled. The most radiation-sensitive basic units of pulse voltage stabilizers are revealed. Recommendations for increasing their radiation resistance are given.
Russian Microelectronics – Springer Journals
Published: Jul 12, 2012
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