ISSN 10637397, Russian Microelectronics, 2012, Vol. 41, No. 4, pp. 251–258. © Pleiades Publishing, Ltd., 2012.
Original Russian Text © L.N. Kessarinskiy, D.V. Boychenko, A.Y. Nikiforov, 2012, published in Mikroelektronika, 2012, Vol. 41, No. 4, pp. 275–283.
One of the important problems of designing space
equipment is the creation of an effective power supply
system. The base element of the modern power supply
system is, as a rule, a pulse voltage stabilizer.
Modern pulse voltage stabilizers (PVSs) are complex
hybrid units, for which stringent requirements on the
stability and accuracy of the output voltage, maximal
output power, and control flexibility are specified. The
use of pulse voltage stabilizers in space equipment also
imposes requirements on radiation resistance. When
the pulse voltage stabilizers operate in the radiation
conditions present in space, they are subjected to the
actions of electrons and protons of the Earth’s radiation
belt, which causes dose ionization effects; and they are
subjected to the actions of heavy charge particles and
highenergy protons of cosmic space, which cause sin
gleevent local ionization effects [1–3].
Due to dose effects, the gradual time degradation
of the main parameters–feasibility criteria of pulse
voltage stabilizers (first of all, accuracy stabilization
parameters of the output voltage) and catastrophic
The performed experimental investigations of the
dose behavior of over 50 types of modern pulse voltage
stabilizers of domestic and foreign origins show the
variety of their resistance levels in a range of 1.2 up to
360 krad (Fig. 1). The wide ranges of implementation
versions leads to strong varieties of resistance indices
of the pulse voltage stabilizer even in families which
characteristics. Thus, the problem of
revealing the most sensitive units to radiation is urgent
This work was performed by SPELS and the Institute of Extre
mal Applied Electronics of the National Research Nuclear Uni
versity MEPhI under State Contract no. 13.G36.31.007 of
October 22, 2010 with the Ministry of Education and Science of
the Russian Federation.
for producing recommendations on increasing dose
resistance levels of the pulse voltage stabilizer [4, 5].
The singleevent local ionization effects in pulse
voltage stabilizers develop as highpower shortlength
pulse responses of electrical parameters (current and
voltages) and, more seldom, as catastrophic failures.
The description of most critical units and modules of
pulse voltage stabilizers and particular experimental
data on their resistance to heavy charged particles and
highenergy protons are virtually absent in domestic
references, and, therefore, their acquisition is also, no
The main units of the pulse voltage stabilizers are
(i) highpower switch element;
(ii) error amplifier;
(iii) galvanic feedback signal decoupling; and
(iv) widthpulse modulator.
In the process of studies, the structure of each unit
of modern pulse voltage stabilizers was analyzed.
Then, objects were selected for experimental studies,
i.e., typical representatives of the element base, used
for creating pulse voltage stabilizers. The obtained
experimental results were analyzed to determine spe
cial features of the microcircuit operation as part of
the pulse voltage stabilizer unit. Based on the results of
the analysis, a conclusion was drawn regarding the
radiation sensitivity of the functional unit, which is the
part of the pulse voltage stabilizer, and its influence on
the characteristics of the converters on the whole.
2. ANALYSIS OF DOSE EFFECTS OF UNITS
IN THE PULSE VOLTAGE STABILIZERS
Highpower discrete MOS transistors are used as
switch elements in modern pulse voltage stabilizers.
An Analysis of the Radiation Behavior of Pulse Voltage Stabilizers
L. N. Kessarinskiy
, D. V. Boychenko
, and A. Y. Nikiforov
Specialized Electronic Systems (SPELS), Moscow, Russia
National Research Nuclear University MEPhI, Russia
email: email@example.com; firstname.lastname@example.org; email@example.com
Received December 16, 2011
—A typical structure of modern hybrid microcircuits of pulse voltage stabilizers (PVSs) is analyzed.
Experiential studies of dose and singleevent local ionization effects in basic units of modern pulse voltage
stabilizers are performed. The model of pulse voltage stabilizers for analyzing singleevent effects is proposed,
and its experimental verification is fulfilled. The most radiationsensitive basic units of pulse voltage stabiliz
ers are revealed. Recommendations for increasing their radiation resistance are given.