A Study of Materials of Silicate Production by Means of X-Ray Fluorescent Spectrometers of the “Spektroskan” Series

A Study of Materials of Silicate Production by Means of X-Ray Fluorescent Spectrometers of the... Refractories and Industrial Ceramics Vol. 41, Nos. 9 – 10, 2000 MODERN METHODS OF ANALYSIS A STUDY OF MATERIALS OF SILICATE PRODUCTION BY MEANS OF X-RAY FLUORESCENT SPECTROMETERS OF THE “SPEKTROSKAN” SERIES E. N. Maiorova Translated from Ogneupory i Tekhnicheskaya Keramika, No. 9, pp. 31 – 34, September, 2000. are measured at a small step in the chosen wavelength range X-ray fluorescent analysis (XRFA) has been used for where the fluorescence lines of the determined elements lie. many years for studying silicates in geology [1, 2] and in various branches of industry [3] for controlling the elemental These measurements have the form of a dependence of the composition in all stages of the technological process. In the analytical signal on the wavelength and are said to be the cement industry, this method of analysis is included in the spectrum of the given sample in the chosen wavelength GOST 5382–91 standard. range. The Spektron-OPTÉL Production Association has deve- The dependence between the intensity (brightness) of the loped and produced a series of Spektroskan spectrometers line of fluorescence and the content of the element to which for determining the content of chemical elements in moun- this line belongs allows us to http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Refractories and Industrial Ceramics Springer Journals

A Study of Materials of Silicate Production by Means of X-Ray Fluorescent Spectrometers of the “Spektroskan” Series

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Kluwer Academic Publishers-Plenum Publishers
Copyright © 2000 by Plenum Publishing Corporation
Materials Science; Characterization and Evaluation of Materials; Materials Science, general; Ceramics, Glass, Composites, Natural Materials
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