Real-time built-in self-testing (BIST) of digital devices that incorporate functional modules of various speed is considered. A method of designing a pattern generator is suggested. This generator is capable of forming pseudorandom test patterns both with the normal speed (one test vector per clock cycle) and with a speed several times higher (several test vectors per clock cycle). With these generators, at-speed testing of multichip module components can be performed to detect both stuck-at and ac faults.
Russian Microelectronics – Springer Journals
Published: Oct 10, 2004
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