A High-Speed Pseudorandom Test Pattern Generator

A High-Speed Pseudorandom Test Pattern Generator Real-time built-in self-testing (BIST) of digital devices that incorporate functional modules of various speed is considered. A method of designing a pattern generator is suggested. This generator is capable of forming pseudorandom test patterns both with the normal speed (one test vector per clock cycle) and with a speed several times higher (several test vectors per clock cycle). With these generators, at-speed testing of multichip module components can be performed to detect both stuck-at and ac faults. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

A High-Speed Pseudorandom Test Pattern Generator

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2001 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1009477910121
Publisher site
See Article on Publisher Site

Abstract

Real-time built-in self-testing (BIST) of digital devices that incorporate functional modules of various speed is considered. A method of designing a pattern generator is suggested. This generator is capable of forming pseudorandom test patterns both with the normal speed (one test vector per clock cycle) and with a speed several times higher (several test vectors per clock cycle). With these generators, at-speed testing of multichip module components can be performed to detect both stuck-at and ac faults.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 10, 2004

References

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