A device for controlling the voltage standing-wave ratio of microwave attenuators

A device for controlling the voltage standing-wave ratio of microwave attenuators The main properties, operation principles, and the area of engineering application of a device for controlling the voltage standing-wave ratio (VSWR) of microwave attenuators are considered. A dynamic continuous method is developed for controlling and measuring the VSWR of microwave devices. This method is advantageous over the conventional stationary discrete method, which does not meet the requirements of modern microwave engineering and market efficiency. The device was tested experimentally, as well as in the commercial production of M3-104, M3-105, and M3-106 absorbed-power wattmeters. The results of the study are based on modern methods of the theory of radio measurements and therefore can be used in the design and testing of microwave devices. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

A device for controlling the voltage standing-wave ratio of microwave attenuators

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Publisher
Springer Journals
Copyright
Copyright © 2009 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739709050096
Publisher site
See Article on Publisher Site

Abstract

The main properties, operation principles, and the area of engineering application of a device for controlling the voltage standing-wave ratio (VSWR) of microwave attenuators are considered. A dynamic continuous method is developed for controlling and measuring the VSWR of microwave devices. This method is advantageous over the conventional stationary discrete method, which does not meet the requirements of modern microwave engineering and market efficiency. The device was tested experimentally, as well as in the commercial production of M3-104, M3-105, and M3-106 absorbed-power wattmeters. The results of the study are based on modern methods of the theory of radio measurements and therefore can be used in the design and testing of microwave devices.

Journal

Russian MicroelectronicsSpringer Journals

Published: Sep 19, 2009

References

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