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Use of combined NAA and SIMS analyses for impurity level isotope detection

Use of combined NAA and SIMS analyses for impurity level isotope detection Neutron activation analysis (NAA) offers advantages for detecting impurity levels of select isotopes that have suitable neutron cross sections. Secondary ion mass spectrometry (SIMS) on the other hand detects most isotopes, but suffers various molecular interferences and covers only a small beam size volume per run. These two methods are combined here to study a large number of isotopes in titanium thin films in an electrolytic cell experiment. Nine isotopes are covered by NAA and over 50 with SIMS. An overlap in the data sets allows a normalization of SIMS data to the more accurate NAA measurements. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Radioanalytical and Nuclear Chemistry Springer Journals

Use of combined NAA and SIMS analyses for impurity level isotope detection

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Publisher
Springer Journals
Copyright
Copyright © 2005 by Springer-Verlag/Akadémiai Kiadó
Subject
Chemistry; Inorganic Chemistry; Physical Chemistry; Diagnostic Radiology; Nuclear Physics, Heavy Ions, Hadrons; Nuclear Chemistry
ISSN
0236-5731
eISSN
1588-2780
DOI
10.1007/s10967-005-0644-6
Publisher site
See Article on Publisher Site

Abstract

Neutron activation analysis (NAA) offers advantages for detecting impurity levels of select isotopes that have suitable neutron cross sections. Secondary ion mass spectrometry (SIMS) on the other hand detects most isotopes, but suffers various molecular interferences and covers only a small beam size volume per run. These two methods are combined here to study a large number of isotopes in titanium thin films in an electrolytic cell experiment. Nine isotopes are covered by NAA and over 50 with SIMS. An overlap in the data sets allows a normalization of SIMS data to the more accurate NAA measurements.

Journal

Journal of Radioanalytical and Nuclear ChemistrySpringer Journals

Published: Feb 1, 2005

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