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- Publisher
- Springer Journals
- Copyright
- Copyright © 2005 by Springer-Verlag
- Subject
- Physics; Condensed Matter Physics; Optical and Electronic Materials; Nanotechnology; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Operating Procedures, Materials Treatment
- ISSN
- 0947-8396
- eISSN
- 1432-0630
- DOI
- 10.1007/s00339-004-3189-6
- Publisher site
- See Article on Publisher Site
Abstract
In-plane c-axis oriented CaBi4Ti4O15 (CBTi144) films were fabricated on Pt foils using a complex metal alkoxide solution. The a/b-axis orientation of the ferroelectric films was affected by the preferred orientation of Pt foil, which is associated with the thickness. The 500 nm-thick CBTi144 films showed good ferro- and piezoelectric properties on 0.010 mm-thick Pt foils. The Pr and Ec were 26 μC/cm2 and 230 kV/cm, respectively, at an applied voltage of 75 V. The d33 was characterized as 25–34 pm/V by piezoresponse force microscopy. The values enhanced compared to those of the CBTi144 thin film with random orientation. The polar-axis oriented CBTi144 films would open for novel devices as Pb-free piezoelectric materials.
Journal
Applied Physics A: Materials Science Processing – Springer Journals
Published: Feb 17, 2005