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M. Bokalič, K. Brecl, M. Topič (2014)
EL inspection of thin-film PV modules in between field operation2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
M. Topič, J. Sites, K. Zaunbrecher, J. Raguse, K. Brecl, M. Bokalič (2012)
SPICE Simulations of Circumstances at Monolithic Contacts of CdTe Modules Supported by Electroluminescent Measurements
Ka-Hyun Kim, S. Kasouit, Erik Johnson, P. Cabarrocas (2013)
Substrate versus superstrate configuration for stable thin film silicon solar cellsSolar Energy Materials and Solar Cells, 119
Jaeger-Waldau Arnulf (2012)
PV Status Report 2012
O. Breitenstein, H. Höffler, J. Haunschild (2014)
Photoluminescence image evaluation of solar cells based on implied voltage distributionSolar Energy Materials and Solar Cells, 128
B. Michl, M. Padilla, I. Geisemeyer, Stephen Haag, F. Schindler, M. Schubert, W. Warta (2014)
Imaging Techniques for Quantitative Silicon Material and Solar Cell AnalysisIEEE Journal of Photovoltaics, 4
M. Bokalič, G. ČCernivec, A. Demolliens, J. Revel, M. Topič, M. Poličnik, U. Merc (2010)
Electroluminescence Findings and IR LED I-V Curve Measurement in (Wafer-based) Solar Cell Module Production
[Electroluminescence imaging is extended to the photovoltaic (PV) module level. Qualitative characterisation of different types of commercially available PV devices is made based on electroluminescence measurements and photographic images. Examples include a conventional crystalline silicon PV module, a chalcopyrite PV module, a cadmium telluride PV module, an amorphous silicon single junction PV module, a tandem micromorph silicon PV module, and a flexible triple junction silicon PV module. For each type of module the discussion focuses on their topology and general electroluminescence intensity distribution, as well as a description of observed inhomogeneities.]
Published: Jan 23, 2015
Keywords: Electroluminescence; Photovoltaic modules; Chalcopyrite (CIGS); Cadmium telluride (CdTe); Amorphous silicon; Micromorph silicon
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