Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

From scientific instrument to industrial machineSystems Architecture

From scientific instrument to industrial machine: Systems Architecture [This introductory chapter discusses the important system architectural aspects of a transmission electron microscope and how these are influenced by new market demands. It starts by discussing system-wide architectural considerations and the challenges imposed by current and future industrial markets. Then it looks at how new market demands (e.g. automation, repeatability and ease-of-use) change the architectural key drivers significantly, and therefore lead to architectural stress in the current system. Finally, architectural patterns and new design concepts for a next system architecture for the transmission electron microscope are discussed.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

From scientific instrument to industrial machineSystems Architecture

Part of the SpringerBriefs in Electrical and Computer Engineering Book Series
Editors: Doornbos, Richard; van Loo, Sjir
Doornbos, Richard; van Loo, Sjir
From scientific instrument to industrial machine — Apr 28, 2012
Download PDF
11 pages

Loading next page...
 
/lp/springer-journals/from-scientific-instrument-to-industrial-machine-systems-architecture-sWlS6ljQ0a

References (0)

References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.

Publisher
Springer Netherlands
Copyright
© The Author(s) 2012
ISBN
978-94-007-4146-1
Pages
9 –19
DOI
10.1007/978-94-007-4147-8_2
Publisher site
See Chapter on Publisher Site

Abstract

[This introductory chapter discusses the important system architectural aspects of a transmission electron microscope and how these are influenced by new market demands. It starts by discussing system-wide architectural considerations and the challenges imposed by current and future industrial markets. Then it looks at how new market demands (e.g. automation, repeatability and ease-of-use) change the architectural key drivers significantly, and therefore lead to architectural stress in the current system. Finally, architectural patterns and new design concepts for a next system architecture for the transmission electron microscope are discussed.]

Published: Apr 28, 2012

Keywords: Systems architecture; Electron microscope; Key drivers; System qualities

There are no references for this article.