Access the full text.
Sign up today, get DeepDyve free for 14 days.
Loading next page...
/lp/springer-journals/a-characterisation-of-thick-film-resistors-for-strain-gauge-2meC0zwdM4
References (10)
-
C. Canali, D. Malavasi, B. Morten, M. Prudenziati, A. Taroni (1980)
Piezoresistive effects in thick‐film resistorsJournal of Applied Physics, 51
-
M. Hrovat, J. Holc, D. Belavic, S. Šoba (1994)
An evaluation of some commercial thick film resistor materials for strain gaugesJournal of Materials Science Letters, 13
-
M. Subramanian, G. Aravamùdan, G. Rao (1983)
Oxide pyrochlores — A reviewProgress in Solid State Chemistry, 15
-
M. Hrovat, D. Belavic, Z. Samardz̆ija, J. Holc (2000)
Characteristics of thick-film resistors, fired under dielectric layerJournal of Materials Science Letters, 19
-
A. Bishay, D. Abdelhady, A. Darwish (1992)
Applicability of discontinuous palladium films as strain gaugesJournal of Materials Science: Materials in Electronics, 3
-
K. Hoffman (1989)
An Introduction to Measurements Using Strain Gauges -
M. Prudenziati, B. Morten, F. Cilloni, G. Ruffi (1989)
Very high strain sensitivity in thick-film resistors: real and false super gauge factors.Sensors and Actuators, 19
-
M. Hrovat, G. Dražič, J. Holc, D. Belavic (1995)
Correlation between microstructure and gauge factors of thick film resistorsJournal of Materials Science Letters, 14
-
B. Morten, A. Masoero, M. Prudenziati, T. Manfredini (1994)
Evolution of ruthenate-based thick film cermet resistorsJournal of Physics D, 27
-
B. Bethune (1976)
The surface cracking of glassy polymers under a sliding spherical indenterJournal of Materials Science, 11
- Publisher
- Springer Journals
- Copyright
- Copyright © 2001 by Kluwer Academic Publishers
- Subject
- Materials Science; Materials Science, general; Characterization and Evaluation of Materials; Polymer Sciences; Continuum Mechanics and Mechanics of Materials; Crystallography and Scattering Methods; Classical Mechanics
- ISSN
- 0022-2461
- eISSN
- 1573-4803
- DOI
- 10.1023/A:1017908728642
- Publisher site
- See Article on Publisher Site
Abstract
Some commercial thick film resistors with sheet resistivities from 1 kohm/sq. up to 1 Mohm/sq. were evaluated for strain gauge applications. Temperature coefficients of resistivity, noise indices and gauge factors (GFs) were measured. For the same resistor series GFs and noise indices increase with increasing sheet resistivity. However, both GFs and noise indices are different for resistors with the same nominal sheet resistivity but from different resistor series. The results indicated that the microstructure rather than the different chemical composition of the conductive phase in thick film resistors is the primary reason for the different gauge factors.
Journal
Journal of Materials Science – Springer Journals
Published: Oct 17, 2004