Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating

Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Proceedings of SPIE SPIE

Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating

Proceedings of SPIE, Volume 3568 (1) – Jan 19, 1999

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Publisher
SPIE
Copyright
Copyright © 2003 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
ISSN
0277-786X
eISSN
1996-756X
D.O.I.
10.1117/12.336833
Publisher site
See Article on Publisher Site

Abstract

High spatial frequencies in the illuminating light of microscopes lead to a shift of the object spatial frequencies detectable through the objective lens. If a suitable procedure is found for evaluation of the measured data, a microscopic image with a higher resolution than under flat illumination can be obtained. A simple method for generation of a laterally modulated illumination pattern is discussed here. A specially constructed diffraction grating was inserted in the illumination beam path at the conjugate object plane (position of the adjustable aperture) and projected through the objective into the object. Microscopic beads were imaged with this method and evaluated with an algorithm based on the structure of the Fourier space. The results indicate an improvement of resolution.

Journal

Proceedings of SPIESPIE

Published: Jan 19, 1999

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