Diffraction-Pattern Sampling For Automatic Pattern Recognition

Diffraction-Pattern Sampling For Automatic Pattern Recognition This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: diffraction-pattern generation, diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development, facility description, and experimental results which have been obtained over the last few years at General Motors' AC Electronics-Defense Research Laboratories in Santa Barbara, California. Sampling the diffraction pattern results in a sample - signature - a different one for each sampling geometry. The kinds of information obtainable from sample-signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Proceedings of SPIE SPIE

Diffraction-Pattern Sampling For Automatic Pattern Recognition

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Publisher
SPIE
Copyright
COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
ISSN
0277-786X
eISSN
1996-756X
DOI
10.1117/12.946835
Publisher site
See Article on Publisher Site

Abstract

This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: diffraction-pattern generation, diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development, facility description, and experimental results which have been obtained over the last few years at General Motors' AC Electronics-Defense Research Laboratories in Santa Barbara, California. Sampling the diffraction pattern results in a sample - signature - a different one for each sampling geometry. The kinds of information obtainable from sample-signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery.

Journal

Proceedings of SPIESPIE

Published: Dec 9, 1969

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