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SNIM: Scanning near-field infrared microscopy

SNIM: Scanning near-field infrared microscopy Scanning near-field infrared microscopy is a powerful label-free technique for chemical imaging with nanometre resolution. It is on the verge of wide-spread applications due to the development of tuneable, easy access high power infrared light sources. Spatial resolution of 10–100 nm is nowadays routinely obtained. Current research activities are shifting from pure instrument development towards applications in the field of material science and biology. This includes detection of the Mott-transition in nano-domains, mapping of the doping concentration in semiconductors, surface characterization with a sensitivity of a single monolayer, and infrared spectroscopy of a single virus. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Annual Reports Section "C" (Physical Chemistry) Royal Society of Chemistry

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Publisher
Royal Society of Chemistry
Copyright
This journal is © The Royal Society of Chemistry
ISSN
0260-1826
eISSN
1460-4787
DOI
10.1039/b703982b
Publisher site
See Article on Publisher Site

Abstract

Scanning near-field infrared microscopy is a powerful label-free technique for chemical imaging with nanometre resolution. It is on the verge of wide-spread applications due to the development of tuneable, easy access high power infrared light sources. Spatial resolution of 10–100 nm is nowadays routinely obtained. Current research activities are shifting from pure instrument development towards applications in the field of material science and biology. This includes detection of the Mott-transition in nano-domains, mapping of the doping concentration in semiconductors, surface characterization with a sensitivity of a single monolayer, and infrared spectroscopy of a single virus.

Journal

Annual Reports Section "C" (Physical Chemistry)Royal Society of Chemistry

Published: Apr 1, 2008

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