Microscopy in this issue

Microscopy in this issue Article Precise method for measuring spatial coherence in TEM beams using Airy diffraction patterns Jun Yamasaki, Yuki Shimaoka and Hirokazu Sasaki We have developed a method to precisely measure spatial coherence in electron beams by fitting the Airy diffraction pattern of the selector aperture. The method does not require an electron biprism and can be implemented in existing analytical transmission electron microscopes equipped with a post-column energy filter. Microscopy 67:1 1–10; doi:10.1093/jmicro/dfx093 Article Contrast of positively charged oxide precipitate in out-lens, in-lens and in-column SE image Šárka Mikmeková, Haruo Nakamichi and Masayasu Nagoshi Secondary electron (SE) imaging is one of the most important mode in the SEM. State-of-the-art SEMs are equipped with highly sophisticated detection systems and enable to share the SE signal by several detectors. Filtered SE images contain additional information about the specimen to that of an unfiltered one. Microscopy 67:1 11–17; doi:10.1093/jmicro/dfx117 Article Collection efficiency and acceptance maps of electron detectors for understanding signal detection on modern scanning electron microscopy Toshihide Agemura and Takashi Sekiguchi The trajectories of secondary electrons and backscattered electrons in a modern scanning electron microscope were simulated to evaluate the signals of plural electron detectors. The energies and acceptance angles of detected electrons depend on not only detector geometry but also working distance. Microscopy 67:1 18–29; doi:10.1093/jmicro/dfx124 Article Crystal structures of high-pressure phases formed in Si by laser irradiation Hiroyuki Iwata, Daisuke Kawaguchi and Hiroyasu Saka Laser induced modified volumes (LIMV's) in Si were studied by TEM. In LIMV, beside voids, dislocations, micro-cracks and what had been supposed to be an unidentified high-pressure phase (hpp) of Si were observed. The so-called “hpp” was identified mostly as diamond Si (DS). Microscopy 67:1 30–36; doi:10.1093/jmicro/dfx128 Article Development of a real-time wave field reconstruction TEM system (II): correction of coma aberration and 3-fold astigmatism, and real-time correction of 2-fold astigmatism Takahiro Tamura, Yoshihide Kimura and Yoshizo Takai A function for the correction of coma aberration, 3-fold astigmatism and real-time correction of 2-fold astigmatism was newly incorporated into a recently developed real-time wave field reconstruction transmission electron microscopy system. All of these aberration corrections, as well as auto focus tracking, were performed at a video frame rate of 1/30 s. Microscopy 67:1 37–45; doi:10.1093/jmicro/dfx127 Letter Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector Shigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, Hidetaka Sawada, Naoya Shibata and Yuichi Ikuhara We developed 300 kV TEM equipped with a fifth-order aberration corrector (delta corrector) for STEM. The contrast flat area in a Ronchigram expanded to 70 mrad. We demonstrated a spatial resolution of 40.5 pm by obtaining an ADF STEM image of GaN [212] with a convergence angle of 40 mrad. Microscopy 67:1 46–50; doi:10.1093/jmicro/dfx122 Technical Report Gold nanoparticle printed coverslips to facilitate fluorescence-TEM correlative microscopy Neeraj Prabhakar, Anni Määttänen, Jouko Peltonen, Pekka Hänninen, Markus Peurla and Jessica M. Rosenholm Gold nanoparticle patterns inkjet-printed on glass coveslips have high contrast in reflection mode of fluorescence microscopy, under stereo microscope in embedding the cells for transmission electron microscopy, and in the polymerized block face, facilitating tracking of cells through different imaging modalities in correlative light and electron microscopy experiments. Microscopy 67:1 51–54; doi:10.1093/jmicro/dfx118 © The Author(s) 2018. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microscopy Oxford University Press

Microscopy in this issue

Microscopy , Volume 67 (1) – Feb 1, 2018

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Publisher
Oxford University Press
Copyright
© The Author(s) 2018. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com
ISSN
0022-0744
eISSN
1477-9986
D.O.I.
10.1093/jmicro/dfy011
Publisher site
See Article on Publisher Site

Abstract

Article Precise method for measuring spatial coherence in TEM beams using Airy diffraction patterns Jun Yamasaki, Yuki Shimaoka and Hirokazu Sasaki We have developed a method to precisely measure spatial coherence in electron beams by fitting the Airy diffraction pattern of the selector aperture. The method does not require an electron biprism and can be implemented in existing analytical transmission electron microscopes equipped with a post-column energy filter. Microscopy 67:1 1–10; doi:10.1093/jmicro/dfx093 Article Contrast of positively charged oxide precipitate in out-lens, in-lens and in-column SE image Šárka Mikmeková, Haruo Nakamichi and Masayasu Nagoshi Secondary electron (SE) imaging is one of the most important mode in the SEM. State-of-the-art SEMs are equipped with highly sophisticated detection systems and enable to share the SE signal by several detectors. Filtered SE images contain additional information about the specimen to that of an unfiltered one. Microscopy 67:1 11–17; doi:10.1093/jmicro/dfx117 Article Collection efficiency and acceptance maps of electron detectors for understanding signal detection on modern scanning electron microscopy Toshihide Agemura and Takashi Sekiguchi The trajectories of secondary electrons and backscattered electrons in a modern scanning electron microscope were simulated to evaluate the signals of plural electron detectors. The energies and acceptance angles of detected electrons depend on not only detector geometry but also working distance. Microscopy 67:1 18–29; doi:10.1093/jmicro/dfx124 Article Crystal structures of high-pressure phases formed in Si by laser irradiation Hiroyuki Iwata, Daisuke Kawaguchi and Hiroyasu Saka Laser induced modified volumes (LIMV's) in Si were studied by TEM. In LIMV, beside voids, dislocations, micro-cracks and what had been supposed to be an unidentified high-pressure phase (hpp) of Si were observed. The so-called “hpp” was identified mostly as diamond Si (DS). Microscopy 67:1 30–36; doi:10.1093/jmicro/dfx128 Article Development of a real-time wave field reconstruction TEM system (II): correction of coma aberration and 3-fold astigmatism, and real-time correction of 2-fold astigmatism Takahiro Tamura, Yoshihide Kimura and Yoshizo Takai A function for the correction of coma aberration, 3-fold astigmatism and real-time correction of 2-fold astigmatism was newly incorporated into a recently developed real-time wave field reconstruction transmission electron microscopy system. All of these aberration corrections, as well as auto focus tracking, were performed at a video frame rate of 1/30 s. Microscopy 67:1 37–45; doi:10.1093/jmicro/dfx127 Letter Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector Shigeyuki Morishita, Ryo Ishikawa, Yuji Kohno, Hidetaka Sawada, Naoya Shibata and Yuichi Ikuhara We developed 300 kV TEM equipped with a fifth-order aberration corrector (delta corrector) for STEM. The contrast flat area in a Ronchigram expanded to 70 mrad. We demonstrated a spatial resolution of 40.5 pm by obtaining an ADF STEM image of GaN [212] with a convergence angle of 40 mrad. Microscopy 67:1 46–50; doi:10.1093/jmicro/dfx122 Technical Report Gold nanoparticle printed coverslips to facilitate fluorescence-TEM correlative microscopy Neeraj Prabhakar, Anni Määttänen, Jouko Peltonen, Pekka Hänninen, Markus Peurla and Jessica M. Rosenholm Gold nanoparticle patterns inkjet-printed on glass coveslips have high contrast in reflection mode of fluorescence microscopy, under stereo microscope in embedding the cells for transmission electron microscopy, and in the polymerized block face, facilitating tracking of cells through different imaging modalities in correlative light and electron microscopy experiments. Microscopy 67:1 51–54; doi:10.1093/jmicro/dfx118 © The Author(s) 2018. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com

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MicroscopyOxford University Press

Published: Feb 1, 2018

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