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The effect of refraction in the small-angle diffraction of X-rays from stacked lamellae

The effect of refraction in the small-angle diffraction of X-rays from stacked lamellae An expression for the scattering of X-rays from a regular stack of lamellae is developed, releasing the prior restraint that no refraction may occur. The effect of refraction is to cause deviations from the classical Bragg condition. Further, a condition of total reflection is shown to occur within systems whose lamellar spacings are greater than a critical value. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General Crystallography International Union of Crystallography

The effect of refraction in the small-angle diffraction of X-rays from stacked lamellae

The effect of refraction in the small-angle diffraction of X-rays from stacked lamellae


Abstract

An expression for the scattering of X-rays from a regular stack of lamellae is developed, releasing the prior restraint that no refraction may occur. The effect of refraction is to cause deviations from the classical Bragg condition. Further, a condition of total reflection is shown to occur within systems whose lamellar spacings are greater than a critical value.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1971 International Union of Crystallography
ISSN
0567-7394
DOI
10.1107/S0567739471000330
Publisher site
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Abstract

An expression for the scattering of X-rays from a regular stack of lamellae is developed, releasing the prior restraint that no refraction may occur. The effect of refraction is to cause deviations from the classical Bragg condition. Further, a condition of total reflection is shown to occur within systems whose lamellar spacings are greater than a critical value.

Journal

Acta Crystallographica Section A: Crystal Physics, Diffraction, Theoretical and General CrystallographyInternational Union of Crystallography

Published: Mar 1, 1971

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