Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

The use of automated optical testing (AOT) in statistical process control (SPC) for printed circuit board (PCB) production

The use of automated optical testing (AOT) in statistical process control (SPC) for printed... Statistical process control is a powerful tool for understanding changes taking place during the manufacture of a printed circuit board. It can be used to raise the product quality and enable trend spotting, as well as leading to overall reduction of product costs and lead times. In this paper, the links between the more traditional methods of inspection and test, and how they have given birth via the conventional automatic optical inspection, to the more sophisticated and state‐of‐the‐art automatic optical testing are explored. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Circuit World Emerald Publishing

The use of automated optical testing (AOT) in statistical process control (SPC) for printed circuit board (PCB) production

Circuit World , Volume 29 (4): 4 – Dec 1, 2003

Loading next page...
 
/lp/emerald-publishing/the-use-of-automated-optical-testing-aot-in-statistical-process-iEEWZu5k1m

References

References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.

Publisher
Emerald Publishing
Copyright
Copyright © 2003 MCB UP Ltd. All rights reserved.
ISSN
0305-6120
DOI
10.1108/03056120310478532
Publisher site
See Article on Publisher Site

Abstract

Statistical process control is a powerful tool for understanding changes taking place during the manufacture of a printed circuit board. It can be used to raise the product quality and enable trend spotting, as well as leading to overall reduction of product costs and lead times. In this paper, the links between the more traditional methods of inspection and test, and how they have given birth via the conventional automatic optical inspection, to the more sophisticated and state‐of‐the‐art automatic optical testing are explored.

Journal

Circuit WorldEmerald Publishing

Published: Dec 1, 2003

Keywords: Printed circuit boards; Statistical process control; Inspection

There are no references for this article.