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The Rle of Rheological Characterisation in the Manufacture of Multilayer Ceramic Capacitors

The Rle of Rheological Characterisation in the Manufacture of Multilayer Ceramic Capacitors The rheology of thick film materials has proven to be a key factor in the fabrication of ceramic capacitors. Alternative techniques have been developed for rheological characterisation which have led to improved raw material control and enhanced product quality. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

The Rle of Rheological Characterisation in the Manufacture of Multilayer Ceramic Capacitors

McAuley, I.
Microelectronics International , Volume 8 (3): 2 – Mar 1, 1991
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Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/eb044458
Publisher site
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Abstract

The rheology of thick film materials has proven to be a key factor in the fabrication of ceramic capacitors. Alternative techniques have been developed for rheological characterisation which have led to improved raw material control and enhanced product quality.

Journal

Microelectronics International – Emerald Publishing

Published: Mar 1, 1991

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