Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

The Justification of 100 Conductor Testing for Improved Yields

The Justification of 100 Conductor Testing for Improved Yields Automatic thickfilm conductor testing performed as a 100 test gives a number of advantages if used correctly and well adjusted to the real needs. Though improved yield in production is the essential benefit of automatic test, a number of advantages and perspectives reach other company divisions outside the thickfilm production area. A number of general guidelines help to define the need and calculate the justification figures for a given production. The quality of the test process itself, however, can be an important part of the calculations. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

The Justification of 100 Conductor Testing for Improved Yields

Hammershj, R.
Microelectronics International , Volume 3 (3): 3 – Mar 1, 1986
Download PDF
3 pages

Loading next page...
 
/lp/emerald-publishing/the-justification-of-100-conductor-testing-for-improved-yields-ZGx4JSsKCi
Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/eb044244
Publisher site
See Article on Publisher Site

Abstract

Automatic thickfilm conductor testing performed as a 100 test gives a number of advantages if used correctly and well adjusted to the real needs. Though improved yield in production is the essential benefit of automatic test, a number of advantages and perspectives reach other company divisions outside the thickfilm production area. A number of general guidelines help to define the need and calculate the justification figures for a given production. The quality of the test process itself, however, can be an important part of the calculations.

Journal

Microelectronics International – Emerald Publishing

Published: Mar 1, 1986

There are no references for this article.