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The application of X‐rays in the failure analysis of electronic devices and systems

The application of X‐rays in the failure analysis of electronic devices and systems Purpose – The aim is to focus on the application of X‐rays in the failure analysis of electronic devices and systems, with an emphasis on X‐ray radiography and X‐ray spectroscopy. Design/methodology/approach – The theory behind X‐ray radiography and X‐ray spectroscopy is reviewed, and relevant case studies are used to illustrate the application of these techniques in the failure analysis of electronic devices and systems. Findings – Examples from recent case studies are given. Originality/value – The paper provides an introduction to X‐ray methods for engineers working on the failure analysis of electronic devices and systems who may be unfamiliar with these techniques. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Circuit World Emerald Publishing

The application of X‐rays in the failure analysis of electronic devices and systems

Circuit World , Volume 34 (3): 9 – Aug 22, 2008

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References (6)

Publisher
Emerald Publishing
Copyright
Copyright © 2008 Emerald Group Publishing Limited. All rights reserved.
ISSN
0305-6120
DOI
10.1108/03056120810896254
Publisher site
See Article on Publisher Site

Abstract

Purpose – The aim is to focus on the application of X‐rays in the failure analysis of electronic devices and systems, with an emphasis on X‐ray radiography and X‐ray spectroscopy. Design/methodology/approach – The theory behind X‐ray radiography and X‐ray spectroscopy is reviewed, and relevant case studies are used to illustrate the application of these techniques in the failure analysis of electronic devices and systems. Findings – Examples from recent case studies are given. Originality/value – The paper provides an introduction to X‐ray methods for engineers working on the failure analysis of electronic devices and systems who may be unfamiliar with these techniques.

Journal

Circuit WorldEmerald Publishing

Published: Aug 22, 2008

Keywords: Radiography; Spectroscopy; Electronic equipment and components

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