Preliminary thermal annealing tests of OLED glass samples

Preliminary thermal annealing tests of OLED glass samples Purpose – The purpose of this paper was to determine the influence of thermal aging on the stability of organic light‐emitting diode (OLED) glass samples made in ambient condition. Design/methodology/approach – The samples with yellow emitting layer (named as ADS5) and poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonate) hole transport layer were examined. Some of the devices were ultraviolet‐curable epoxy encapsulation directly after performance. All samples were thermally annealed at 70°C for 1, 2, 3 and 4 hours. The characteristics current–voltage for fresh and aging samples in the range of voltage from 0‐15 V were made. The temperature of OLEDs samples in real‐time with a thermographic camera was measured too. Additionally, scanning electron microscope image of surface Al cathode immediately after OLED performance and after annealing tests was made. Findings – The authors stated, that irrespective of the type, the samples were undergoing the degradation. The decrease in value of the current density was registered. That were about 44 per cent and about 24 per cent after thermally annealing the samples with and without encapsulation, respectively (at tension 13 V). Additionally, there were observed massive delamination of the metal cathode. Originality/value – Influence of thermal annealing and encapsulation on the dynamic characteristics of the OLED devices fabricated in ambient condition was analyzed. There are not many papers in the literature describing examinations of OLED samples which were made in environmental conditions. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

Preliminary thermal annealing tests of OLED glass samples

Microelectronics International, Volume 31 (3): 5 – Jul 29, 2014

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Publisher
Emerald Publishing
Copyright
Copyright © 2014 Emerald Group Publishing Limited. All rights reserved.
ISSN
1356-5362
DOI
10.1108/MI-10-2013-0047
Publisher site
See Article on Publisher Site

Abstract

Purpose – The purpose of this paper was to determine the influence of thermal aging on the stability of organic light‐emitting diode (OLED) glass samples made in ambient condition. Design/methodology/approach – The samples with yellow emitting layer (named as ADS5) and poly(3,4‐ethylenedioxythiophene):poly(styrenesulfonate) hole transport layer were examined. Some of the devices were ultraviolet‐curable epoxy encapsulation directly after performance. All samples were thermally annealed at 70°C for 1, 2, 3 and 4 hours. The characteristics current–voltage for fresh and aging samples in the range of voltage from 0‐15 V were made. The temperature of OLEDs samples in real‐time with a thermographic camera was measured too. Additionally, scanning electron microscope image of surface Al cathode immediately after OLED performance and after annealing tests was made. Findings – The authors stated, that irrespective of the type, the samples were undergoing the degradation. The decrease in value of the current density was registered. That were about 44 per cent and about 24 per cent after thermally annealing the samples with and without encapsulation, respectively (at tension 13 V). Additionally, there were observed massive delamination of the metal cathode. Originality/value – Influence of thermal annealing and encapsulation on the dynamic characteristics of the OLED devices fabricated in ambient condition was analyzed. There are not many papers in the literature describing examinations of OLED samples which were made in environmental conditions.

Journal

Microelectronics InternationalEmerald Publishing

Published: Jul 29, 2014

Keywords: OLED; Annealing test; Encapsulation; Scanning electron microscope

References

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