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Observations on the characteristics of thick film k 33 strain sensors fabricated on steel substratesThis paper is based on a poster presentation made at the IMAPS 2001 Symposium, Baltimore.

Observations on the characteristics of thick film k 33 strain sensors fabricated on steel... Results are presented from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of printed layers, firing regimes and geometry of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (k 33 ). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that can help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

Observations on the characteristics of thick film k 33 strain sensors fabricated on steel substratesThis paper is based on a poster presentation made at the IMAPS 2001 Symposium, Baltimore.

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Publisher
Emerald Publishing
Copyright
Copyright © 2002 MCB UP Ltd. All rights reserved.
ISSN
1356-5362
DOI
10.1108/13565360210417772
Publisher site
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Abstract

Results are presented from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of printed layers, firing regimes and geometry of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (k 33 ). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that can help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation.

Journal

Microelectronics International – Emerald Publishing

Published: Apr 1, 2002

Keywords: Thick film; Temperature; Steel

References

  • Effects of aspect ratio on the temperature coefficient of resistance matching and low frequency noise levels in thick film strain sensors
    Atkinson, J.K.; Sion, R.P.; Zhang, Z.
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    Crescini, D.; Marioli, D.; Taroni, A.
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    Ellis, M.E.; Richter, F.; Levitsky, M.E.
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    Holmes, P.J.
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    Levitsky, M.E.; Flick, S.; Malanga, D.
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    Prudenziati, M.; Morten, B.; Cilloni, F.; Ruffi, G.
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  • A theoretical and experimental investigation of accelerometer design using thick‐film technology
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  • A novel low‐cost sensor for measuring cylinder pressure and improving performance of an internal combustion engine
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  • The design of a novel accelerometer for automotive applications using thick film transduction
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  • A study of the piezoresistive effect in thick‐film resistors and its application to load transduction
    White, N.M.