Access the full text.
Sign up today, get DeepDyve free for 14 days.
Results are presented from a programme of research aimed at establishing the mechanisms behind the effects of fabrication parameter variation on the performance of thick film strain gauges on steel substrates. The research is aimed at describing the effect on the repeatability of the device characteristics due to different choices of materials, thicknesses of printed layers, firing regimes and geometry of the gauges. In particular the effects of load and temperature on the offset and gain characteristics of a variety of different sensor constructions have been explored. The sensors described here are of a type where the applied strain is parallel to the measured resistance path but orthogonal to the substrate (k 33 ). It has been found that these devices exhibit different characteristics to conventional thick film strain gauges that can help explain the mechanisms affecting gain and offset changes caused by temperature fluctuations and mechanical deformation.
Microelectronics International – Emerald Publishing
Published: Apr 1, 2002
Keywords: Thick film; Temperature; Steel
Read and print from thousands of top scholarly journals.
Already have an account? Log in
Bookmark this article. You can see your Bookmarks on your DeepDyve Library.
To save an article, log in first, or sign up for a DeepDyve account if you don’t already have one.
Copy and paste the desired citation format or use the link below to download a file formatted for EndNote
Access the full text.
Sign up today, get DeepDyve free for 14 days.
All DeepDyve websites use cookies to improve your online experience. They were placed on your computer when you launched this website. You can change your cookie settings through your browser.