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Influence of Composition and Construction Parameters on the Basic Properties of Thick Film Thermistors

Influence of Composition and Construction Parameters on the Basic Properties of Thick Film... This paper presents experimental data associated with the properties of thick film thermistors based on a spineltype semiconducting oxideRuO2glass system. The following parameterssheet resistivity, thermistor B and thermal time constantshave been measured, all as functions of different composition and construction variants. The thermistor properties are independent of configuration and are mainly determined by the semiconducting oxide particle chains. The correlation between B and for the compositions considered has been observed. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

Influence of Composition and Construction Parameters on the Basic Properties of Thick Film Thermistors

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Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/eb044568
Publisher site
See Article on Publisher Site

Abstract

This paper presents experimental data associated with the properties of thick film thermistors based on a spineltype semiconducting oxideRuO2glass system. The following parameterssheet resistivity, thermistor B and thermal time constantshave been measured, all as functions of different composition and construction variants. The thermistor properties are independent of configuration and are mainly determined by the semiconducting oxide particle chains. The correlation between B and for the compositions considered has been observed.

Journal

Microelectronics InternationalEmerald Publishing

Published: Feb 1, 1992

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