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Matthew Brown, D. Lowe (2007)
Automatic Panoramic Image Stitching using Invariant FeaturesInternational Journal of Computer Vision, 74
J. Lellmann, Björn Lellmann, Florian Widmann, C. Schnörr (2013)
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Wen-Yang Chang, Chih-Ping Tsai (2014)
Automatic Inspection and Processing Based on Vision Stitching and Spectral Illumination
R. Su, Changming Sun, T. Pham (2012)
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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 20XX 1 Image restoration
Jiaya Jia, Chi-Keung Tang (2007)
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE , VOL . ? , NO . ? , ? 2007 1 Image Stitching Using Structure Deformation
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Exact order based feature descriptor for illumination robust image matchingPattern Recognit., 46
D. Lowe (2004)
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George Hoberg, Marty Luckert, David Haley, Benjamin Cashore, Michael Howlett, J. Rayner (1945)
University of British Columbia.Canadian Medical Association journal, 53 6
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Purpose – This study aims to investigate the spectral illumination characteristics and geometric features of bicycle parts and proposes an image stitching method for their automatic visual inspection. Design/methodology/approach – The unrealistic color casts of feature inspection is removed using white balance for global adjustment. The scale-invariant feature transforms (SIFT) is used to extract and detect the image features of image stitching. The Hough transform is used to detect the parameters of a circle for roundness of bicycle parts. Findings – Results showed that maximum errors of 0°, 10°, 20°, 30°, 40° and 50° for the spectral illumination of white light light-emitting diode arrays with differential shift displacements are 4.4, 4.2, 7.8, 6.8, 8.1 and 3.5 per cent, respectively. The deviation error of image stitching for the stem accessory in x and y coordinates are 2 pixels. The SIFT and RANSAC enable to transform the stem image into local feature coordinates that are invariant to the illumination change. Originality/value – This study can be applied to many fields of modern industrial manufacturing and provide useful information for automatic inspection and image stitching.
Assembly Automation – Emerald Publishing
Published: Sep 9, 2014
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