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Effect of Ag content on the microstructure of Sn‐Ag‐Cu based solder alloys

Effect of Ag content on the microstructure of Sn‐Ag‐Cu based solder alloys Purpose – The purpose of this paper is to examine the microstructure and evaluate the intermetallic compounds in the following lead‐free solder alloys: Sn 98.5 Ag 1.0 Cu 0.5 (SAC105) Sn 97.5 Ag 2.0 Cu 0.5 (SAC205) Sn 96.5 Ag 3.0 Cu 0.5 (SAC305) and Sn 95.5 Ag 4.0 Cu 0.5 (SAC405). Design/methodology/approach – X‐ray diffraction (XRD) and scanning electron microscopy (SEM) were employed to identify the main intermetallics formed during solidification. Differential scanning calorimetry (DSC) was used to investigate the undercooling properties of each of the alloys. Findings – By using XRD analysis in addition to energy dispersive spectroscopy (EDS) it was found that the main intermetallics were Cu 6 Sn 5 and Ag 3 Sn in a Sn matrix. Plate‐like ϵ‐Ag 3 Sn intermetallics were observed for all four alloys. Solder alloys SAC105, SAC205 and SAC305 showed a similar microstructure, while SAC405 displayed a fine microstructure with intermetallic phases dense within the Sn matrix. Originality/value – Currently, low‐silver content SAC alloys are being investigated due to their lower cost, however, the overall reliability of an alloy can be greatly affected by the microstructure and this should be taken into consideration when choosing an alloy. The size and number of Ag 3 Sn plate‐like intermetallics can affect the reliability as they act as a site for crack propagation. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Soldering & Surface Mount Technology Emerald Publishing

Effect of Ag content on the microstructure of Sn‐Ag‐Cu based solder alloys

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References (30)

Publisher
Emerald Publishing
Copyright
Copyright © 2008 Emerald Group Publishing Limited. All rights reserved.
ISSN
0954-0911
DOI
10.1108/09540910810902651
Publisher site
See Article on Publisher Site

Abstract

Purpose – The purpose of this paper is to examine the microstructure and evaluate the intermetallic compounds in the following lead‐free solder alloys: Sn 98.5 Ag 1.0 Cu 0.5 (SAC105) Sn 97.5 Ag 2.0 Cu 0.5 (SAC205) Sn 96.5 Ag 3.0 Cu 0.5 (SAC305) and Sn 95.5 Ag 4.0 Cu 0.5 (SAC405). Design/methodology/approach – X‐ray diffraction (XRD) and scanning electron microscopy (SEM) were employed to identify the main intermetallics formed during solidification. Differential scanning calorimetry (DSC) was used to investigate the undercooling properties of each of the alloys. Findings – By using XRD analysis in addition to energy dispersive spectroscopy (EDS) it was found that the main intermetallics were Cu 6 Sn 5 and Ag 3 Sn in a Sn matrix. Plate‐like ϵ‐Ag 3 Sn intermetallics were observed for all four alloys. Solder alloys SAC105, SAC205 and SAC305 showed a similar microstructure, while SAC405 displayed a fine microstructure with intermetallic phases dense within the Sn matrix. Originality/value – Currently, low‐silver content SAC alloys are being investigated due to their lower cost, however, the overall reliability of an alloy can be greatly affected by the microstructure and this should be taken into consideration when choosing an alloy. The size and number of Ag 3 Sn plate‐like intermetallics can affect the reliability as they act as a site for crack propagation.

Journal

Soldering & Surface Mount TechnologyEmerald Publishing

Published: Sep 19, 2008

Keywords: Solder; Alloys; Reliability management

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