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Dendritic Growth from Dielectric Constituents in Thick Film ICs

Dendritic Growth from Dielectric Constituents in Thick Film ICs Silver and other metals can exhibit dendritic shortcircuit growth caused by electrochemical migration in conductorinsulator structures. Detailed analysis of migrationfree thick film systems using migrationfree conductors has demonstrated that not only metallic components, but also dielectric constituent materials can contribute to the formation of migrated shorts after a chemical reduction process. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

Dendritic Growth from Dielectric Constituents in Thick Film ICs

Microelectronics International , Volume 9 (1): 6 – Jan 1, 1992

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Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/eb044469
Publisher site
See Article on Publisher Site

Abstract

Silver and other metals can exhibit dendritic shortcircuit growth caused by electrochemical migration in conductorinsulator structures. Detailed analysis of migrationfree thick film systems using migrationfree conductors has demonstrated that not only metallic components, but also dielectric constituent materials can contribute to the formation of migrated shorts after a chemical reduction process.

Journal

Microelectronics InternationalEmerald Publishing

Published: Jan 1, 1992

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