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Cumulative degradation methodology to predict reliability of electronic systems

Cumulative degradation methodology to predict reliability of electronic systems The purpose of this paper is to describe a novel methodology for predicting reliability for consumer electronics or any other hardware systems that experience a complex lifecycle environmental profile.Design/methodology/approachThis Physics-of-Failure–based three-step methodology can be used to predict the degradation rate of a population using a Monte Carlo approach. The three steps include: using an empirical equation describing the degradation of a performance metric, a degradation consistency condition and a technique to account for cumulative degradation across multiple life-cycle stress conditions (e.g. temperature, voltage, mechanical load, etc.).FindingsTwo case studies are provided to illustrate the methodology including one related to repeated touch-load induced artifacts for displays.Originality/valueThis novel methodology can be applied to a wide range of applications from mechanical systems to electrical circuits. The results can be fed into the several stages of engineering validation to speed up product qualification. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Circuit World Emerald Publishing

Cumulative degradation methodology to predict reliability of electronic systems

Thiel, George; Griggio, Flavio; Tiku, Sanjay
Circuit World , Volume 48 (4): 9 – Nov 24, 2022
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Publisher
Emerald Publishing
Copyright
© Emerald Publishing Limited
ISSN
0305-6120
eISSN
0305-6120
DOI
10.1108/cw-08-2020-0195
Publisher site
See Article on Publisher Site

Abstract

The purpose of this paper is to describe a novel methodology for predicting reliability for consumer electronics or any other hardware systems that experience a complex lifecycle environmental profile.Design/methodology/approachThis Physics-of-Failure–based three-step methodology can be used to predict the degradation rate of a population using a Monte Carlo approach. The three steps include: using an empirical equation describing the degradation of a performance metric, a degradation consistency condition and a technique to account for cumulative degradation across multiple life-cycle stress conditions (e.g. temperature, voltage, mechanical load, etc.).FindingsTwo case studies are provided to illustrate the methodology including one related to repeated touch-load induced artifacts for displays.Originality/valueThis novel methodology can be applied to a wide range of applications from mechanical systems to electrical circuits. The results can be fed into the several stages of engineering validation to speed up product qualification.

Journal

Circuit World – Emerald Publishing

Published: Nov 24, 2022

Keywords: Reliability; Degradation; Physics of failure; Prediction methods; Monte Carlo methods; Load relaxation; Display; Touch

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